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    Materials Science and Engineering of Carbon

    Materials Science and Engineering of Carbon

    - Characterization

    Forfatter: info mangler
    Bog
    • Format
    • Bog, hardback
    • Engelsk

    Beskrivelse

    Materials Science and Engineering of Carbon: Characterization discusses 12 characterization techniques, focusing on their application to carbon materials, including X-ray diffraction, X-ray small-angle scattering, transmission electron microscopy, Raman spectroscopy, scanning electron microscopy, image analysis, X-ray photoelectron spectroscopy, magnetoresistance, electrochemical performance, pore structure analysis, thermal analyses, and quantification of functional groups. Each contributor in the book has worked on carbon materials for many years, and their background and experience will provide guidance on the development and research of carbon materials and their further applications.

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  • Vægt840 g
    • coffee cup img
    10 cm
    book img
    19,1 cm
    23,5 cm

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    Characterization Magnetoresistance Image analysis Structure Morphology Surface chemistry Microscopy Graphitization Carbonization sem Activated Carbon Fast Fourier transform Surface Area Differential Scanning Calorimetry Carbon materials Titration Surface analysis Surface modification Functionalization Capacitance Porous carbon Microtexture Adsorption/desorption isotherm air exposure Backscattered Electrons Crystal grain size Crystallite Size Carbon family Degree of graphitization Differential thermogravimetry Electric double-layer capacitor (EDLC)Electrochemical analysis Differential thermal analysis Crystal structure characterization Degree of functionalization Diffraction and imaging techniques Inorganic matters Electron channeling pattern Electron channeling micrograph First-order Raman spectrum Nanostructured carbon Lattice constant Orientation function nanotexture Pore Volume Reaction base Pore structure Interlayer Spacing Interlayer spacing d002 Small-angle X-ray scattering (SAXS)X-ray scattering State analysis Selective neutralization TEM data secondary electrons Structural and textural characterization Temperature programmed desorption (TPD)Thermogravimetry Measurement cell Raman parameters Secondary reaction Semiquantitative analysis Oxygen-containing functional groups X-ray diffraction (XRD)X-ray photoelectron spectroscopy (XPS)

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