X-Ray Microscopy: Proceedings of the International Symposium, Gottingen, Fed. Rep. of Germany, September 14 16, 1983

indgår i serie Springer Series in Optical Sciences


X-Ray Microscopy: Proceedings of the International Symposium, Gottingen, Fed. Rep. of Germany, September 14 16, 1983
Format:
Bog, hæftet
Udgivelsesdato:
01-10-2013
Sprog:
Engelsk
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X-ray microscopy fills a gap between optical and electron microscopy. Using soft x-rays, a resolution higher than with visible light can be obtained. In comparison to electron microscopy, thick, wet, unstained specimens can be examined. This is especially advantageous for biological applications. The intense synchrotron radiation of electron storage rings and the de­ velopment of optical elements for soft x-rays render x-ray microscopy feasi­ ble for basic research. Wider applications will be possible in the future with the development of laboratory x-ray sources and microscopes. In 1979 a conference on x-ray microscopy was organized by the New York Academy of Sciences and in 1981 a symposium on high resolution soft x-ray optics was held at Brookhaven. The present volume contains the contributions to the sympos i um "X-Ray Microscopy", organ i zed by the Akademie der Wi ssen­ schaften in Gottingen in September 1983. In their capacity as conference chairmen, the editors would like to thank the Akademie der Wissenschaften, especially Prof. H.G. Wagner, Secretary of the Academy, and Mr. J. Pfahlert for organizing the symposium. We are in­ debted to the Stiftung Volkswagenwerk for financial support. The symposium was held at the Max-Planck-Institut fUr Stromungsforschung. We are grateful for their hospitality and assistance during the symposium. Thanks are due to all authors and to the Springer Verlag for their combined efforts. We thank Dipl.-Phys. P. Guttmann, Dr. B. Niemann and Mrs. A. Marienhagen for their assistance during the final preparation of the manuscripts.

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ISBN13:
9783662135471
Vægt:
490 g
Dybde:
19 mm
Bredde:
152 mm
Højde:
229 mm
Forlag:
Springer
Format:
Hæftet
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    X-Ray Microscopy: Proceedings of the International Symposium, Gottingen, Fed. Rep. of Germany, September 14 16, 1983

    indgår i serie Springer Series in Optical Sciences

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