VLSI Design and Test : 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings

indgår i serie Communications in Computer and Information Science


VLSI Design and Test : 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings
Format:
Bog, hæftet
Udgivelsesdato:
01-12-2013
Sprog:
Engelsk
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This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

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ISBN13:
9783642420238
Vægt:
567 g
Dybde:
21 mm
Bredde:
156 mm
Højde:
234 mm
Forlag:
Springer
Format:
Hæftet
  • Forfattere

    Vis mereVis mindre

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    VLSI Design and Test : 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings

    indgår i serie Communications in Computer and Information Science

    • Leveringstid 4-6 hverdage
    • Forventet levering 26-06-2019

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