Principles of Electron Optics, Volume 2

- Applied Geometrical Optics

  • Format
  • Bog, paperback
  • Engelsk

Beskrivelse

Principles of Electron Optics: Applied Geometrical Optics, Second Edition gives detailed information about the many optical elements that use the theory presented in Volume 1: electrostatic and magnetic lenses, quadrupoles, cathode-lens-based instruments including the new ultrafast microscopes, low-energy-electron microscopes and photoemission electron microscopes and the mirrors found in their systems, Wien filters and deflectors. The chapter on aberration correction is largely new. The long section on electron guns describes recent theories and covers multi-column systems and carbon nanotube emitters. Monochromators are included in the section on curved-axis systems. The lists of references include many articles that will enable the reader to go deeper into the subjects discussed in the text. The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography.

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Detaljer
  • SprogEngelsk
  • Sidetal766
  • Udgivelsesdato13-12-2017
  • ISBN139780128133699
  • Forlag Academic Press Inc
  • FormatPaperback
Størrelse og vægt
  • Vægt20 g
  • coffee cup img
    10 cm
    book img
    19,1 cm
    23,4 cm

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    Mirrors Holography OPTIMIZATION Pico Field Electron Emission Aplanat LEEM Curvilinear coordinates PEEM Ceos Nion Monochromators Multipoles aberrations Aberration measurement Aberration Coefficients All-electrostatic corrector Astigmatic tube lens Aperture effects Axial conductors Arc lens Astigmatic lens caustics Brightness function Bell-shaped model Carbon nanotube emitters Calculation of space charge distribution Castaing-Henry analyser Annular systems Biplanar lens Bipotential lenses Blade focus Boersch effect Classified bibliography of the different devices Cross focus Cone-edge focus cusp Delta corrector Cathode matching Cambridge STEM project Canonical mapping transform Electrostatic prisms Emittance diagrams Electron lithography EMBL low-voltage SEM Cathode lenses Chicago project Curved optic axis Chromatic aberration correction Darmstadt project Einzel lenses Emittance ellipses Field models Cone focus Grivet-Lenz model Crossed lens Foil lenses Forbes-Deane theory Fowler-Nordheim equation Fringe-field monochromators Fringing fields Grid lenses Hyperemittance Gauze lenses Ichinokawa analysers In-column analysers Diode approximation Dynamic correction of chromatic aberration High-frequency lenses Intensity distribution Energy analysers Line focus Möllenstedt analysers Lenz's theory of brightness Line currents Mirror electron microscope Lauer's theory Ferrite shields Fujita-Shimoyama theory Mask fabrication Mean brightness Multi-electron-beam devices Generalized brightness function Permanent-magnet lenses Post-column analysers Quadrupole-octopole corrector Pierce guns Practical gun optics Quadrupoles Helical axis Mandoline filters Model potentials Octopoles Moving objective lens Multielectrode lenses Nakabushi's unified theory Mini-lenses Pancake lenses Paraxial equations Radial lens

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