Handbook of Optical Metrology

- Principles and Applications, Second Edition

Forfatter: info mangler
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  • Denne udgave
  • Bog, hardback
  • Engelsk

Beskrivelse

Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text:

Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elementsAddresses interferometry, holography, and speckle methods and applicationsExplains Moiré metrology and the optical heterodyne measurement methodDelves into the specifics of diffraction, scattering, polarization, and near-field opticsConsiders applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapesThis new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.

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Detaljer
  • SprogEngelsk
  • Sidetal920
  • Udgivelsesdato09-04-2015
  • ISBN139781466573598
  • Forlag CRC Press Inc
  • FormatHardback
Størrelse og vægt
  • Vægt1837 g
  • coffee cup img
    10 cm
    book img
    17,8 cm
    25,4 cm

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    Photogrammetry Scattering Holography Ellipsometry Diffraction Polarimetry Interferometry Microscopy Polarization Fizeau Interferometer High speed photography Near-field optics Flow measurement Coordinate measuring machine Solid Mechanics Light propagation Laser Doppler Velocimetry Energy Density Optical Metrology Optical film Profilometry 3D Shape Measurement Akiko Hirai Akihiko Chaki Anand Asundi Baoliang (Bob) Wang Car Industry Measurement Car Industry Inspection Birefringence Measurement Circular Polarization Cheng-Chung Lee Digital Holographic Interferometry Diffraction Grating Digital Hologram Fiber Sensor Fiber Sensor Application Gordon M. Brown Fast Axis Fringe Pattern Giancarlo Pedrini David A. Page Guoyong Zhang Digital Holographic Displacement Vector Hiroo Tsumuraya Interference Fringes Katsuichi Kitagawa Kazuhide Kamiya Kenji Magara Jun-ichi Kato Lateral Shearing Interferometer Em Wave Industrial Bore-Scope Industrial Endoscope Mariko Kajima Frank Chen Lev T. Perelman Moiré Metrology Masao Hirano Fringe Analysis Optical Flat Optical Heterodyne Measurement Method Optical Heterodyne Method Optical Length Optical Lense Optical Mechatronics Optical Thin Film Nandigana Krishna Mohan Mueller Matrices Optical CT Natalia Dushkina Object Surface Optical Coating Optical Flatness Optical Micro-Profile Optical Prism Hiroyuki Fujiwara Optical Computed Tomography Optical Film Surface Optical Method Optical Surface Roughness Peter R. Hall Rainer Tutsch Semiconductor Industry Inspection Semiconductor Industry Measurement Sang Joon Lee Shribak Michael Light source Linear Polarization Shuichi Sakai Speckle Application Souichi Telada Speckle Method Surface Profilometry Tatsuo Shiina Three-Dimensional Shape Measurement Wenhao Huang Video Probe Spherical Aberration Optical Device Optical Film Thickness Optical Parallelism Lianhua Jin Motohiro Suyama Nobuo Kochi Quarter Wave Plate On-Machine Measurement Optical Mirror Mumin Song Optical Displacement Optical Probe Optical Size Optical Straightness Optoelectronic Sensor Optomechanical Element Reference Grating Stokes Parameter René Schödel Peter J. de Groot Ruedi Thalmann Takashi Nomura Shigetaro Ogura Stokes Vector Xi Li Toshitaka Wakayama Toshiyuki Takatsuji Youichi Bitou Yukitoshi Otani

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