Defects in Microelectronic Materials and Devices

af


Defects in Microelectronic Materials and Devices
Du sparer Spar kr. 25,00 med Saxo Premium
  • Leveringstid 2-3 uger
  • Forventet levering 11-03-2020
Hvis du køber til medlemspris, bliver du automatisk medlem af Saxo Premium. De første 30 dage er gratis, derefter koster det 99,-/md. Medlemskabet fornyes automatisk og kan altid opsiges. Læs mere om alle fordelene her.
Format:
Bog, paperback
Udgivelsesdato:
07-10-2019
Sprog:
Engelsk
  • Beskrivelse
  • Yderligere info
  • Anmeldelser

Uncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can be damaged during the increasingly complicated fabrication processes required to produce them.A comprehensive survey of defects that occur in silicon-based metal-oxide semiconductor field-effect transistor (MOSFET) technologies, this book also discusses flaws in linear bipolar technologies, silicon carbide-based devices, and gallium arsenide materials and devices. These defects can profoundly affect the yield, performance, long-term reliability, and radiation response of microelectronic devices and integrated circuits (ICs). Organizing the material to build understanding of the problems and provide a quick reference for scientists, engineers and technologists, this text reviews yield- and performance-limiting defects and impurities in the device silicon layer, in the gate insulator, and/or at the critical Si/SiO2 interface. It then examines defects that impact production yield and long-term reliability, including:Vacancies, interstitials, and impurities (especially hydrogen)Negative bias temperature instabilitiesDefects in ultrathin oxides (SiO2 and silicon oxynitride)Take A Proactive Approach The authors condense decades of experience and perspectives of noted experimentalists and theorists to characterize defect properties and their impact on microelectronic devices. They identify the defects, offering solutions to avoid them and methods to detect them. These include the use of 3-D imaging, as well as electrical, analytical, computational, spectroscopic, and state-of-the-art microscopic methods. This book is a valuable look at challenges to come from emerging

Vis mereVis mindre

Udgivelsesdato:
07-10-2019
ISBN13:
9780367386399
Vægt:
1430 g
Bredde:
178 mm
Højde:
254 mm
Format:
Paperback
Forfattere

Vis mereVis mindre

Vis mereVis mindre

Fandt du ikke hvad du søgte?

Hvis denne bog ikke er noget for dig, kan du benytte kategorierne nedenfor til at finde andre titler. Klik på en kategori for at se lignende bøger.

Velkommen til Saxo - din danske boghandel!

Hos os kan du handle som Gæst, Saxo-bruger eller Saxo Premium-medlem. Du bestemmer selv, og vores kundeservice sidder altid klar med hjælp.

Om medlemspriser hos Saxo

Hvis du køber til medlemspris, bliver du automatisk medlem og får del i de mange fede fordele. De første 30 dage er gratis for nye brugere, og derefter koster det kun 99,-/md. Medlemskabet fornyes automatisk, og du kan altid opsige det. Læs mere om fordelene ved Saxo Premium her.

Machine Name: SAXO032