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Assessing Fault Model and Test Quality

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Assessing Fault Model and Test Quality
Du sparer 36% Du sparer 36%
  • Bog, hæftet (kr. 1.179,95) (kr. 1.179,95)
    • kr. 1.849,95
    • Leveringstid 5-7 hverdage
    • Forventet levering 21-11-2018
    • 36%
    Format:
    Bog, hæftet
    Udgivelsesdato:
    01-09-2012
    Sprog:
    Engelsk
    Sidetal:
    156
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    1. Beskrivelse

      For many years, the dominant fault model in automatic test pattern gen­ eration (ATPG) for digital integrated circuits has been the stuck-at fault model. The static nature of stuck-at fault testing when compared to the extremely dynamic nature of integrated circuit (IC) technology has caused many to question whether or not stuck-at fault based testing is still viable. Attempts at answering this question have not been wholly satisfying due to a lack of true quantification, statistical significance, and/or high computational expense. In this monograph we introduce a methodology to address the ques­ tion in a manner which circumvents the drawbacks of previous approaches. The method is based on symbolic Boolean functional analyses using Or­ dered Binary Decision Diagrams (OBDDs). OBDDs have been conjectured to be an attractive representation form for Boolean functions, although cases ex­ ist for which their complexity is guaranteed to grow exponentially with input cardinality. Classes of Boolean functions which exploit the efficiencies inherent in OBDDs to a very great extent are examined in Chapter 7. Exact equa­ tions giving their OBDD sizes are derived, whereas until very recently only size bounds have been available. These size equations suggest that straight­ forward applications of OBDDs to design and test related problems may not prove as fruitful as was once thought.

      Andre udgaver:

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    2. Yderligere info
      ISBN13:
      9781461366027
      Vægt:
      231 g
      Dybde:
      8 mm
      Bredde:
      156 mm
      Højde:
      234 mm
      Forlag:
      Springer
      Format:
      Hæftet
    3. Anmeldelser

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